OS Tester
OS Tester GTS - 420
GTS - 420
| DESCRIPTION | SPECIFICATION |
|---|---|
| Size | 780(W) X 680(L) X 1,060(H) |
| Test Site | 1, 2, 4para |
| Test Items | Open/Short, Daisy Chain, CRES |
| Test Time | 0.8ms/Per pin |
| Test Channel | 2,560pin |
| Test Method | ISVM |
| Voltage Range | -5V ≤ V ≤ 0V |
| FI Range | -40mA ≤ I ≤ 0mA |
| Current Range | -10uA, -100uA, -1mA, -10mA, -40mA |
| Resolution | 12 bit |
OS Tester GTS - 1200
GTS - 1200
| DESCRIPTION | SPECIFICATION |
|---|---|
| Size | 820(W) X 715(L) X 1,000-1120(H) |
| Test Site | 1, 2, 4, 8, 16, 32para |
| Test Items | Open/Short, Daisy Chain, CRES, RLC (Option) |
| Test Time | 0.5ms/Per pin |
| Test Channel | 4,800pin |
| Test Method | ISVM, VSIM |
| Voltage Range | -10V ≤ V ≤ +10V |
| FI Range | -80mA ≤ I ≤ +80mA |
| Current Range | ±5uA, ±20uA, ±200uA, ±2mA, ±80mA |
| Resolution | 16 bit |